Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

20-04-2012

Publisher

International Electrotechnical Committee

IEC 61837-1:2012 deals with standard outlines and terminal lead connections as they apply to SMDs for frequency control and selection in plastic moulded enclosures and is based on IEC 61240.

This publication is to be read in conjunction with IEC 61240:1994.

Committee	TC 49
DevelopmentNote	To be read in conjunction with IEC 61240. (04/2012) Stability Date: 2017. (11/2017)
DocumentType	Standard
Pages	44
PublisherName	International Electrotechnical Committee
Status	Current
Supersedes	IEC 61837-1:1999

Standards	Relationship
NF EN 61837-1 : 2013	Identical
NBN EN 61837-1 : 2012	Identical
NEN EN IEC 61837-1 : 2012	Identical
PN EN 61837-1 : 2013	Identical
BS EN 61837-1:2012	Identical
CEI EN 61837-1 : 2013	Identical
DIN EN 61837-1:2012-12	Identical
UNE-EN 61837-1:2012	Identical
EN 61837-1:2012	Identical

15/30325282 DC : 0	BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
BS EN 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification
BS EN 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement
I.S. EN 60444-8:2017	MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS
I.S. EN 60679-1:2017	PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 60444-8:2017	Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
14/30282293 DC : 0	BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
EN 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 60444-8:2016	Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
I.S. EN 62884-1:2017	MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT
IEC 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
BS EN 60444-8:2017	Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
EN 60679-1:2017	Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
IEC 62884-1:2017	Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

IEC 61240:2016

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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IEC 61837-1:2012

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Abstract

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