Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic

Available format(s)

Hardcopy , PDF

Language(s)

Japanese, English

Published date

20-03-2005

Publisher

Japanese Standards Association

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This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to be stored and/or to function under conditions of high relative humidity and to observe the effects of such high humidity when combined with important temperature changes. This test may also be used for similar devices when specified in a detail specification.

DocumentType	Test Method
Pages	0
PublisherName	Japanese Standards Association
Status	Current

Standards	Relationship
IEC 60512-11-12:2002	Identical

Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

JIS C 5402-1-1:2005	Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination
JIS C 5402-2-1:2005	Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method
JIS C 5402-3-1:2005	Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance

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JIS C 5402-11-12:2005

Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic

Table of Contents

Abstract

General Product Information

International Equivalents

History

Standards Referenced By This Book

Category

Subcategory