NEN 10747-11 : 1986 AMD 2 1997
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 11: SECTIONAL SPECIFICATION FOR DISCRETE DEVICES
Published date
12-01-2013
Publisher
Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, tests and measurement procedures required for the assessment of semiconductor devices.
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