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IEC 60747-11:1985

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Semiconductor devices. Discrete devices. Part 11: Sectionalspecification for discrete devices

Available format(s)

Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

31-12-2021

Published date

01-01-1985

FOREWORD
PREFACE
Clause
1 Scope
2 General
  2.1 Related documents
  2.2 Recommended values of temperatures (preferred
      values)
  2.3 Recommended values of voltages and currents
      (preferred values)
  2.4 Terminal identification
  2.5 Colour codes for type designation
      2.5.1 For JEDEC type numbers
      2.5.2 For PRO ELECTRON type numbers
      2.5.3 Any other type numbers
3 Quality assessment procedures
  3.1 Primary stage of manufacture
  3.2 Structurally similar devices
      3.2.1 Grouping for electrical tests
      3.2.2 Grouping for dimensional, climatic and
            mechanical inspections or tests
      3.2.3 Grouping for endurance tests
  3.3 Inspection requirements for qualification approval
  3.4 Quality conformance inspection
      3.4.1 Division into groups and sub-groups
            Table I - Group A: Lot by lot
            Table II - Group B: Lot by lot
            Table III - Group C: Periodic
  3.5 Group D tests
  3.6 Screening
      Table IV - Screening
  3.7 Sampling requirements
      Table V - Sampling requirements for Group A tests
      Table VI - Sampling requirements for Groups B and C
                 tests, in which LTPD shall be used
4 Test and measurement procedures

Applies to discrete semiconductor devices, excluding optoelectronicdevices. Should be read together with the generic specification towhich it refers: it gives details of the Quality AssessmentProcedures, the inspection requirements, screening sequences,sampling requirements, test and measurement procedures required forthe assessment of semiconductor devices.

DevelopmentNote
Also numbered as BS QC750100(1986) (08/2005) Stability Date: 2015. (10/2012)
DocumentType
Standard
Pages
55
PublisherName
International Electrotechnical Committee
Status
Withdrawn

Standards Relationship
PN 90/T-01204 : 1990 Identical
DIN IEC 60747-11:1992-04 Identical
NEN 10747-11 : 1986 AMD 2 1997 Identical
UTEC 96 011 : 1989 Identical
AS 2547.1.11-1986 Identical
BS QC 750000(1986) : 1986 Identical

BS QC 750111:1991 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
IEC 61747-1:1998+AMD1:2003 CSV Liquid crystal and solid-state display devices - Part 1: Generic specification
00/203087 DC : DRAFT AUG 2000 IEC 62147 - INTEGRATED CIRCUITS - UNIFIED QUALIFICATION STANDARD TO MEET IECQ AND END-USER CERTIFICATION
IEC 60747-4-1:2000 Semiconductor devices - Discrete devices - Part 4-1: Microwave diodes and transistors - Microwave field effect transistors - Blank detail specification

IEC 60747-10:1991 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

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