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SEMI MF1049:2008(R2018)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Practice for Shallow Etch Pit Detection on Silicon Wafers

Available format(s)

Hardcopy

Superseded date

15-12-2023

Language(s)

English

Published date

01-10-2018

This Practice covers detection of high densities of shallow etch pits on silicon wafers doped either p- or n-type and with resistivities as low as 0.005 Ω·cm.

DocumentType
Standard
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy
Supersedes

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$284.63
Including GST where applicable

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