Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-04-2010

Publisher

British Standards Institution

IEC 60747-14-5:2010 is applicable to semiconductor PN-junction temperature sensors and defines terms, definitions, symbols, essential ratings, characteristics and test methods that can be used to determine the characteristics of semiconductor types of PN-junction temperature sensors.

Committee	EPL/47
DevelopmentNote	Supersedes 07/30164953 DC. (04/2010)
DocumentType	Standard
Pages	22
PublisherName	British Standards Institution
Status	Current
Supersedes	07/30164953 DC : 0

Standards	Relationship
IEC 60747-14-5:2010	Identical

IEC 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-1:2002	Semiconductor devices - Mechanical and climatic test methods - Part 1: General
IEC 60749-36:2003	Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
IEC 60747-14-1:2010	Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors
IEC 60721-3-0:1984+AMD1:1987 CSV	Classification of environmental conditions - Part 3: Classification of groups of environmental parameters and their severities - Introduction
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60749-6:2017	Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
IEC 60721-3-1:1997	Classification of environmental conditions - Part 3 Classification of groups of environmental parameters and their severities - Section 1: Storage