CEI EN 60749-20-1 : 2010
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 20-1: HANDLING, PACKING, LABELLING AND SHIPPING OF SURFACE-MOUNT DEVICES SENSITIVE TO THE COMBINED EFFECT OF MOISTURE AND SOLDERING HEAT
Hardcopy , PDF
English
01-01-2010
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 General applicability and
reliability considerations
5 Dry packing
6 Drying
7 Use
Annex A (normative) - Symbol
and labels for
moisture-sensitive
devices
Annex B (informative) - Board
rework
Annex C (informative) - Derating
due to factory environmental
conditions
Bibliography
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