NBN EN 60749-27 : 2007 AMD 1 2012
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 27: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - MACHINE MODEL (MM)
12-01-2013
1 Scope
2 Normative references
3 Terms and definitions
4 Equipment
4.1 MM ESD waveform generator
4.2 Waveform verification equipment
5 MM current waveform requirements
5.1 General
5.2 Waveform qualification and verification
6 Device specific evaluation considerations
6.1 Sample size and test conditions
6.2 Worst-case pin or standard qualification board
7 Classification procedure
7.1 Device requirements
7.2 Device selection
7.3 Device characterization
7.4 Device stress levels
7.5 Pin combinations
7.6 Order of test
8 Failure criteria
9 Classification criteria
10 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
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