Name: NBN EN 60749-3 : 2003
Brand: NBN

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION

Published date

12-01-2013

Publisher

Belgian Standards

Foreword
1 Scope
2 Test apparatus
3 Procedure
4 Failure criteria
5 Summary

Verifies that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.

DocumentType	Standard
PublisherName	Belgian Standards
Status	Current

Standards	Relationship
DIN EN 60749-3:2003-04	Identical
I.S. EN 60749-3:2017	Identical
NF EN 60749-3 : 2002	Identical
BS EN 60749-3:2017	Identical
EN 60749-3:2017	Identical
UNE-EN 60749-3:2003	Identical

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NBN EN 60749-3 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory