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NEN EN IEC 60191-6-20 : 2010

Current

Current

The latest, up-to-date edition.

MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - PART 6-20: GENERAL RULES FOR THE PREPARATION OF OUTLINE DRAWINGS OF SURFACE MOUNTED SEMICONDUCTOR DEVICE PACKAGES - MEASURING METHODS FOR PACKAGE DIMENSIONS OF SMALL OUTLINE J-LEAD PACKAGES (SOJ)

Published date

12-01-2013

Defines methods to measure package dimensions of small outline J-lead packages (SOJ), package outline form E in accordance with IEC 60191-4.

DocumentType
Standard
PublisherName
Netherlands Standards
Status
Current

Standards Relationship
EN 60191-6-20:2010 Identical
IEC 60191-6-20:2010 Identical

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