NF EN 60749-5:2017
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Semiconductor devices - Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
Available format(s)
Hardcopy
Language(s)
English - French
Published date
01-07-2017
Publisher
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
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