Name: SEMI D7 : 1994(R2003)
Brand: SEMI

FPD GLASS SUBSTRATE SURFACE ROUGHNESS MEASUREMENT METHOD

Published date

12-01-2013

Publisher

Semiconductor Equipment & Materials Institute

Specifies the method of FPD glass substrate surface roughness measurement by stylus method surface roughness measurement instrument. For use by vendors and/or buyers of glass substrates for flat panel display and is effective for all glass substrates used.

DevelopmentNote	Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType	Standard
PublisherName	Semiconductor Equipment & Materials Institute
Status	Current

SEMI D9 : 2003(R2015)	TERMINOLOGY FOR FPD SUBSTRATES
SEMI D24 : 2000(R2006)	SPECIFICATION FOR GLASS SUBSTRATES USED TO MANUFACTURE FLAT PANEL DISPLAYS
BS IEC 62899-301-1:2017	Printed electronics Equipment. Contact printing. Rigid master. Measurement method of plate master external dimension
14/30317961 DC : 0	BS EN 62903-1 ED.1 - PRINTED ELECTRONICS - EQUIPMENT - CONTACT PRINTING - RIGID MASTER - MEASUREMENT METHOD OF PLATE MASTER EXTERNAL DIMENSION
IEC 62899-301-1:2017	Printed electronics - Part 301-1: Equipment - Contact printing - Rigid master - Measurement method of plate master external dimension

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SEMI D7 : 1994(R2003)

FPD GLASS SUBSTRATE SURFACE ROUGHNESS MEASUREMENT METHOD

Abstract

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