Name: SN EN 60749-5 : 2003
Brand: SNV

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

Published date

12-01-2013

Publisher

Swiss Standards

Foreword
1 Scope
2 Normative references
3 General
4 Equipment
5 Test conditions
6 Procedures
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
Publications

Covers a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

DocumentType	Standard
PublisherName	Swiss Standards
Status	Current

Standards	Relationship
DIN EN 60749-5:2003-09	Identical
NF EN 60749-5 : 2003	Identical
I.S. EN 60749-5:2017	Identical
EN 60749-5:2017	Identical
BS EN 60749-5:2017	Identical
UNE-EN 60749-5:2003	Identical

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SN EN 60749-5 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 5: STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory