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ASTM F 154 : 2002

ASTM F 154 : 2002

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Standard Guide for Identification of Structures and Contaminants Seen on Specular Silicon Surfaces (Withdrawn 2003)

Available format(s)

Hardcopy , PDF

Withdrawn date

11-05-2013

Language(s)

English

Published date

01-10-2001

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 10.05, 2001 Lists, illustrates, and defines various characters, features, and contaminants seen on highly specular silicon, and gives recommended methods for observing these surface defects. Defects and common synonyms are arranged alphabetically using common name and most probable origins. Describes surfaces after mechanical and chemical polishing, and polished surfaces examined after epitaxial deposition.

This standard was transferred to SEMI (www.semi.org) May 2003

1.1 The purpose of this guide is to list, illustrate, and provide reference for various characteristic features and contaminants that are seen on highly specular silicon wafers. Recommended practices for delineation and observation of these artifacts are referenced. The artifacts described in this guide are intended to parallel and support the content of the SEMI M18. These artifacts and common synonyms are arranged alphabetically in Tables 1 and 2 and illustrated in Figs. 1-68 .

Committee
F 01
DocumentType
Guide
Pages
14
PublisherName
American Society for Testing and Materials
Status
Withdrawn
Supersedes

09/30207175 DC : 0 BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD
ASTM F 522 : 1994 Test Method for Stacking Fault Density of Epitaxial Layers of Silicon by Interference-Contrast Microscopy (Withdrawn 1998)

SEMI M18 : 2012 GUIDE FOR DEVELOPING SPECIFICATION FORMS FOR ORDER ENTRY OF SILICON WAFERS
ASTM F 1241 : 1995 : R2000 Standard Terminology of Silicon Technology (Withdrawn 2003)

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PDF - English
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