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BS EN 60749-17:2003

BS EN 60749-17:2003

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Semiconductor devices. Mechanical and climatic test methods Neutron irradiation

Available format(s)

Hardcopy , PDF

Superseded date

05-15-2019

Language(s)

English

Published date

06-29-2004

Publisher

British Standards Institution

Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary

Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Committee
EPL/47
DevelopmentNote
Supersedes 00/203283 DC. Partially supersedes BS EN 60749 (07/2003)
DocumentType
Standard
Pages
10
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
UNE-EN 60749-17:2003 Identical
NBN EN 60749-17 : 2004 Identical
SN EN 60749-17 : 2003 Identical
DIN EN 60749-17:2003-09 Identical
IEC 60749-17:2003 Identical
EN 60749-17:2003 Identical
I.S. EN 60749-17:2003 Identical
NF EN 60749-17 : 2003 Identical

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Hardcopy - English
PDF - English
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