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DIN EN 60749-17:2003-09

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION

Available format(s)

Hardcopy , PDF

Superseded date

03-07-2021

Language(s)

German

Published date

01-01-2003

Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary

Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

DocumentType
Standard
Pages
7
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Superseded

Standards Relationship
UNE-EN 60749-17:2003 Identical
NBN EN 60749-17 : 2004 Identical
SN EN 60749-17 : 2003 Identical
IEC 60749-17:2003 Identical
EN 60749-17:2003 Identical
I.S. EN 60749-17:2003 Identical
NF EN 60749-17 : 2003 Identical
BS EN 60749-17:2003 Identical

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US$43.14
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