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I.S. EN 60749-17:2003

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by
superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION

Available format(s)

Hardcopy , PDF

Superseded date

05-31-2019

Language(s)

English

Published date

01-01-2003

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary

Defines the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
24
PublisherName
National Standards Authority of Ireland
Status
Superseded
SupersededBy

Standards Relationship
DIN EN 60749-17:2003-09 Identical
EN 60749-17:2003 Identical
NF EN 60749-17 : 2003 Identical
BS EN 60749-17:2003 Identical
NBN EN 60749-17 : 2004 Identical
SN EN 60749-17 : 2003 Identical
IEC 60749-17:2003 Identical
UNE-EN 60749-17:2003 Identical

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US$58.10
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