Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

Published date

08-13-2002

Publisher

European Committee for Standards - Electrical

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.

Committee	CLC/SR 47
DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Current
Supersedes	EN 60749 : 99 AMD 2 2001

Standards	Relationship
IEC 60749-2:2002	Identical
NF EN 60749-2 : 2002	Identical
UNE-EN 60749-2:2003	Identical
NBN EN 60749-2 : 2003	Identical
NEN EN IEC 60749-2 : 2002	Identical
I.S. EN 60749-2:2002	Identical
PN EN 60749-2 : 2004	Identical
BS EN 60749-2:2002	Identical
CEI EN 60749-2 : 2004	Identical
DIN EN 60749-2:2003-04	Identical

IEC 60068-2-13:1983	Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
EN 60068-2-13:1999	Environmental testing - Part 2: Tests - Test M: Low air pressure