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I.S. EN 60749-2:2002

I.S. EN 60749-2:2002

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2002

Publisher

National Standards Authority of Ireland

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications

Deals with the testing of low air pressure on semiconductor devices.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
28
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
BS EN 60749-2:2002 Identical
DIN EN 60749-2:2003-04 Identical
NF EN 60749-2 : 2002 Identical
UNE-EN 60749-2:2003 Identical
NBN EN 60749-2 : 2003 Identical
EN 60749-2:2002 Identical
IEC 60749-2:2002 Identical

IEC 60068-2-13:1983 Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure
EN 60068-2-13:1999 Environmental testing - Part 2: Tests - Test M: Low air pressure

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Hardcopy - English
PDF - English
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