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SEMI T2 : 1998(R2004)

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

SPECIFICATION FOR MARKING OF WAFERS WITH A TWO-DIMENSIONAL MATRIX CODE SYMBOL

Withdrawn date

11-01-2010

Published date

01-12-2013

Intended to provide a marking symbology that can be used to mark silicon wafers with minimum intrusion into the fixed area of the wafer. Defines the spatial and geometric relationships and content (including the error checking and correcting code) of a two-dimensional (2-D), machine-readable, binary matrix code symbol for front surface marking of wafers of silicon which conform to SEMI M1, SEMI M2, or SEMI M11, and other materials with diameters of 125 to 200 mm. Allows for consistency of all wafer marking performed by wafer manufacturers. It may be used in conjunction with, or as an alternative to, the alphanumeric marking codes specified in SEMI M12 and SEMI M13 or a front surface bar code like that specified in SEMI T1.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. E = Editorially modified to correct an error. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Withdrawn

NASA STD 6002 : 2008 APPLYING DATA MATRIX IDENTIFICATION SYMBOLS ON AEROSPACE PARTS
NASA HDBK 6003 : 2008 APPLICATION OF DATA MATRIX IDENTIFICATION SYMBOLS TO AEROSPACE PARTS USING DIRECT PART MARKING METHODS/TECHNIQUES

SEMI T1 : 1995(R2003) SPECIFICATION FOR BACK SURFACE BAR CODE MARKING OF SILICON WAFERS
SEMI M2 : 2003 SPECIFICATION FOR SILICON EPITAXIAL WAFERS FOR DISCRETE DEVICE APPLICATIONS
SEMI M11 : 2004 SPECIFICATIONS FOR SILICON EPITAXIAL WAFERS FOR INTEGRATED CIRCUIT (IC) APPLICATIONS

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