BS 9000-2(1996) : 1996
Current
Current
The latest, up-to-date edition.
GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-1996
Publisher
Committees responsible
Foreword
Specification
1 Scope
2 Operation of the CECC system
3 National procedure for implementation
Annex
A (informative) List of other CECC documents
Details the national organisations relevant to the implementation of the CECC system for electronic components within the UK.
| Committee |
L/9
|
| DevelopmentNote |
Supersedes BS 9000-2(1991) (10/2005)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| BS EN 116300:1994 | Harmonized system of quality assessment for electronic components. Sectional specification: electromechanical all-or-nothing heavy load relays of assessed quality (rated from 5A and above) |
| DEFSTAN 66-31(PT1)/2(2008) : 2008 | BASIC REQUIREMENTS AND TESTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY |
| DEFSTAN 66-31(PT2)/1(2007) : 2007 | BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 2: CONTRACTOR GENERAL REQUIREMENTS |
| BS 9000-3:1996 | General requirements for a system for electronic components of assessed quality Specification for the national implementation of the IECQ system |
| EN 196500:1993/A1:2001 | SECTIONAL SPECIFICATION: MEMBRANE SWITCHES INCLUDING BLANK DETAIL SPECIFICATION EN 196501 |
| DEFSTAN 02-514/2(2008) : 2008 | GUIDE TO CABLE ENTRY, TERMINATION AND JUNCTION COMPONENTS FOR EQUIPMENT |
| BS CECC 90202:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
| DEFSTAN 00-00(PT1)/3(1999) : 1999 | STANDARDS FOR DEFENCE - PART 1: MOD UK STANDARDISATION POLICY, ORGANIZATIONS AND IMPLEMENTATION |
| BS CECC 20000:1983 | Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
| BS CECC 90202:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated operational amplifiers |
| DEFSTAN 66-31(PT1)/1(2007) : 2007 | BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 1: INTRODUCTION AND GUIDE TO THE SPECIFICATION AND SELECTION OF TEST AND MEASUREMENT EQUIPMENT BY THE PROCURING AUTHORITY |
| DEFSTAN 66-31(PT2)/2(2008) : 2008 | BASIC REQUIREMENTS & TESTS FOR ELECTRONIC & ELECTRICAL TEST & MEASUREMENT EQUIPMENT - PART 2: CONTRACTOR GENERAL REQUIREMENTS |
| BS CECC 30500:1989 | Harmonized system of quality assessment for electronic components. Sectional specification: fixed metallized polycarbonate film dielectric capacitors for direct current |
| BS CECC 90111:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits |
| BS EN 168101:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval) |
| BS EN 123400:1992 | Harmonized system of quality assessment for electronic components. Sectional specification: flexible printed boards without through connections |
| BS EN 150001:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes |
| BS EN 114001:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: photomultiplier tubes |
| BS E9065:1976 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: small power transmitting tubes of anode dissipation up to 1 kW |
| BS EN 111100:1992 | Harmonized system of quality assessment for electronic components: sectional specification: display storage tubes |
| BS CECC 90109:1986 | Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU |
| BS EN 123500-800:1992 | Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards with through-connections |
| BS CECC 63000:1990 | Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
| BS EN 123400-800:1992 | Harmonized system of quality assessment for electronic components. Capability detail specification: flexible printed boards without through-connections |
| BS CECC 00802:1994 | Harmonized system of quality assessment for electronic components. Guidance document: CECC Standard method for the specification of surface mounting components (SMDs) of assessed quality |
| BS E9375:1975 | Specification. Harmonized system of quality assessment for electronic components. Blank detail specification: voltage regulator diodes and voltage reference diodes excluding precision-voltage temperature-compensated reference diodes |
| BS CECC 90112:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
| BS CECC 51001:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased |
| BS EN 120003:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays |
| BS 9523:1984 | Rules for the preparation of detail specifications for rectangular electrical connectors of assessed quality with integral metal housings for d.c. and low frequency applications. Full and basic assessment levels |
| BS EN 120006:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: pin-photodiodes for fibre optic applications |
| BS CECC 90114:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA) |
| BS EN 120004:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output |
| BS CECC 200000:1993 | Harmonized system of quality assessment for electronic components. Requirements for process assessment schedules for process approval |
| BS CECC 30501:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed metallized polycarbonate film dielectric capacitors for direct current |
| BS CECC 90302:1986 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators |
| BS CECC 63201:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits (capability approval) |
| BS EN 114000:1993 | Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
| BS CECC 17001:1984 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application |
| BS CECC 90203:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated analogue switching circuits |
| BS EN 190101:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84 |
| BS EN 116200:1997 | Harmonized system of quality assessment for electronic components. Sectional specification. Electromechanical all-or-nothing relays (including relays for severe environmental conditions) |
| BS CECC 75201:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim example. Detail specification/blank detail specification. Circular connectors for frequencies below 3 MHz |
| BS EN 190103:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 63101:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: film and hybrid integrated circuits |
| BS EN 169000:1993 | Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
| BS EN 196500:1993 | Harmonized system of quality assessment for electronic components. Sectional specification. Membrane switches including blank detail specification EN 196501 |
| BS E9063:1976 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: industrial heating triodes |
| BS EN 125400:1993 | Harmonized system of quality assessment for electronic components: sectional specification: adjusters used with magnetic oxide cores for use in inductors and tuned transformers |
| BS EN 150011:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors |
| BS CECC 90104:1990 | Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB |
| BS CECC 90201:1984 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS EN 190116:1994 | Harmonized system of quality assessment for electronic components. Family specification: AC MOS digital integrated circuits |
| BS CECC 90301:1985 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers |
| BS CECC 90115:1994 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital gate array integrated circuits |
| BS EN 150013:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes |
| BS CECC 90113:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits |
| BS EN 120001:1993 | Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor |
| BS EN 125401:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification. Adjusters used with magnetic oxide (ferrite) cores for use in inductors and tuned transformers |
| BS EN 150014:1997 | Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors |
| BS CECC 75301:1992 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Interim Example. Detail specification/blank detail specification: rectangular connectors for frequencies below 3 MHz |
| BS EN 123000:1992 | Harmonized system of quality assessment for electronic components. Generic specification: printed boards |
| BS CECC 90201:1990 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators |
| BS EN 120005:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Photodiodes, photodiode-arrays (not intended for fibre optic applications) |
| BS CECC 30202:1988 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte, porous anode (sub-family 2) |
| BS EN 111101:1996 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Display storage tubes |
| BS EN 120002:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification: infrared emitting diodes, infrared emitting diode arrays |
| BS CECC 75100:1984 | Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application |
| BS CECC 00016:1991 | Harmonized system of quality assessment for electronic components. Basic specification: basic requirements for the use of statistical process control (SPC) in the CECC system |
| PD 9004:1989 | BS 9000, CECC & IECQ UK administrative guide |
| BS EN 100114-6:1997 | CECC Quality assessment procedure for electronic components Technology approval of electronic component manufacturers |
| BS 9000-4:1991 | General requirements for a system for electronic components of assessed quality Specification of procedures for the approval of an organization |
| BS 9000-7:1989 | General requirements for a system for electronic components of assessed quality Specification of lot formation, release procedures and certified test records |
| BS CECC 00112:1991 | Rule of Procedure 12. Voting procedures |
| BS 9000-6:1989 | General requirements for a system for electronic components of assessed quality Specification of capability approval procedures |
| BS EN 100114-1:1997 | Rule of Procedure 14. Quality assessment procedures CECC requirements for the approval of an organization |
| BS 9000-5:1989 | General requirements for a system for electronic components of assessed quality Specification of qualification approval and conformance testing procedures |
| CECC 00300 : 1996 | REGISTER OF CECC SPECIFICATIONS |
| BS CECC 00104:1991 | Rule of Procedure 4. CECC Working Groups. General rules and additional rules |
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