Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

30-06-1988

Publisher

British Standards Institution

Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for interface monolithic
       integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Measuring methods common to digital circuits
4.1.2 Measuring methods common to analogue circuits
4.1.3 Specific methods for interface circuits
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for interface
       monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and supplementary
       information
5.4 Ratings (limited values) (not for inspection
       purposes)
5.5 Recommended conditions for use and associated
       characteristics (not for inspection purposes)
5.6 Supplementary information
5.7 Inspection requirements
5.7.1 Explanation of assessment quality levels P, Y and
       L
5.7.2 Key of abbreviations
       Group A inspection
       Group B inspection
       Group C inspection
       Group D inspection
Annex
A Additional measuring methods

General details, quality assessment procedures, test and measurement procedures and a common blank detail specification.

Committee	EPL/47
DevelopmentNote	To be read in conjunction with BS CECC90000(1991) Supersedes BS CECC90300(1985) & 89/28882 DC (01/2006)
DocumentType	Standard
Pages	26
PublisherName	British Standards Institution
Status	Current
Supersedes	BS CECC 90300:1985

Standards	Relationship
CECC 90300 : 1994	Identical

BS CECC 90000:1991	Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits
BS 6493-1.1:1984	Semiconductor devices. Discrete devices General
BS 6493-2.1:1985	Semiconductor devices. Integrated circuits General
IEC 60747-10:1991	Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
BS 6493-2.2(1986) : 1986	SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - RECOMMENDATIONS FOR DIGITAL INTEGRATED CIRCUITS
BS 9970-0:1985	Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification
IEC 60747-1:2006+AMD1:2010 CSV	Semiconductor devices - Part 1: General
IEC 60617-13:1993	Graphical symbols for diagrams - Part 13: Analogue elements
IEC 60748-1:2002	Semiconductor devices - Integrated circuits - Part 1: General
IEC 60748-2:1997	Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60148:1969	Letter symbols for semiconductor devices and integrated microcircuits
IEC 60748-3:1986	Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
IEC 60748-4:1997	Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
IEC 60617-12:1997	Graphical symbols for diagrams - Part 12: Binary logic elements

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BS CECC 90300:1988

Harmonized system of quality assessment for electronic components. Sectional specification: interface monolithic integrated circuits

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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