BS EN 190100:1993
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
Hardcopy , PDF
English
31-12-1986
Foreword
Preface
1 Scope
2 General
2.1 Related documents
2.2 Preferred voltages for digital monolithic
integrated circuits
2.3 Symbols and terminology
3 Quality assessment procedures
3.1 Structurally similar circuits
3.2 Certified test records
4 Test and measurement procedures
4.1 Electrical measurement procedures
4.1.1 Verification of the function
4.1.2 Measurement of static characteristics
4.1.3 Measurement of dynamic characteristics
4.1.4 Output short-circuit current
4.1.5 Breakdown voltage
4.1.6 Power supply current
4.1.7 Capacitance
4.1.8 Leakage current
4.1.9 Transient energy rating
4.1.10 Input clamping voltage
4.2 Endurance tests
4.2.1 General
4.2.2 Test conditions
5 Common blank detail specification for digital
monolithic integrated circuits
5.1 Introduction
5.2 Front page
5.3 Identification of the component and
supplementary information
5.4 Inspection requirements
5.4.1 Explanation of assessment quality levels, P, Y
and L
5.4.2 Key of abbreviations
Group A inspection
Group B inspection
Group C inspection
Group D inspection
5.5 Requirements for sub-groups A3, A4 and A5
5.5.1 Requirements for TTL combinatorial circuits
5.5.2 Requirements for C.MOS circuits
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