Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

24-06-2004

Publisher

British Standards Institution

FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Specifies temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Committee	EPL/47
DevelopmentNote	Supersedes 02/207670 DC. (10/2004)
DocumentType	Standard
Pages	10
PublisherName	British Standards Institution
Status	Current
Supersedes	02/207670 DC : DRAFT JULY 2002

Standards	Relationship
NF EN 60749-24 : 2005	Identical
EN 60749-24:2004	Identical
IEC 60749-24:2004	Identical
DIN EN 60749-24:2004-09	Identical
NBN EN 60749-24 : 2005	Identical
I.S. EN 60749-24:2004	Identical
UNE-EN 60749-24:2005	Identical

IEC 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-33:2004	Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
EN 60749-33:2004	Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

View more information

$247.06

Including GST where applicable

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Access your standards online with a subscription

Features

Simple online access to standards, technical information and regulations.
Critical updates of standards and customisable alerts and notifications.
Multi-user online standards collection: secure, flexible and cost effective.

Learn more on subscription solutions

Get in touch with us

BS EN 60749-24:2004

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Standards Referencing This Book

Category

Subcategory