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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

Publisher

National Standards Authority of Ireland

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For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

FOREWORD
1 Scope and object
2 Normative references
3 Test apparatus
4 General requirements
5 Test conditions
6 Procedure
7 Failure criteria
8 Safety
9 Summary

Evaluates the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

DevelopmentNote	For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType	Standard
Pages	20
PublisherName	National Standards Authority of Ireland
Status	Current

Standards	Relationship
EN 60749-24:2004	Identical
IEC 60749-24:2004	Identical
DIN EN 60749-24:2004-09	Identical
NBN EN 60749-24 : 2005	Identical
UNE-EN 60749-24:2005	Identical
NF EN 60749-24 : 2005	Identical
BS EN 60749-24:2004	Identical

IEC 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-5:2017	Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-33:2004	Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave
EN 60749-33:2004	Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

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I.S. EN 60749-24:2004

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST

Table of Contents

Abstract

General Product Information

International Equivalents

Standards Referencing This Book

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