SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 24: ACCELERATED MOISTURE RESISTANCE - UNBIASED HAST

Published date

12-01-2013

Publisher

AVANT-PROPOS
1 Domaine d'application et objet
2 Références normatives
3 Appareillage
  3.1 Enregistrements
  3.2 Dispositifs sous contrainte
  3.3 Contamination ionique
  3.4 Eau distillée ou dé ionisée
4 Exigences générales
5 Conditions d'essai
6 Procédure
  6.1 Constitution des conditions d'essais
  6.2 Retour aux conditions initiales
  6.3 Horloge d'Essai
  6.4 Essais électriques
  6.5 Manipulation
7 Critères de défaillance
8 Sécurité
9 Résumé

Specifies temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

DevelopmentNote	Indice de classement: C96-022-24 (12/2005)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-24:2004-09	Identical
EN 60749-24:2004	Identical
BS EN 60749-24:2004	Identical
IEC 60749-24:2004	Identical
UNE-EN 60749-24:2005	Identical
I.S. EN 60749-24:2004	Identical

NF EN 60749-30 : 2005 AMD 1 2011

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING