IEC 60050-561:2014
Current
The latest, up-to-date edition.
International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
Hardcopy , PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
07-11-2014
FOREWORD
INTRODUCTION - Principles and rules followed
1 Scope
2 Terms and definitions
INDEX
IEC 60050-561:2014 gives the terms and definitions for piezoelectric and dielectric devices representing the present state-of-the-art. This new edition reviews and complements the previous one. This terminology is consistent with the terminology developed in the other specialized parts of the IEV.
It has the status of a horizontal standard in accordance with IEC Guide 108.
Committee |
TC 1
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DevelopmentNote |
New child AMD 2 2020 is now added NEW CHILD AMD 3 2021 IS NOW ADDED
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DocumentType |
Standard
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Pages |
348
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ProductNote |
New child AMD 2 2020 is now added NEW CHILD AMD 3 2021 IS NOW ADDED
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PublisherName |
International Electrotechnical Committee
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Status |
Current
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Supersedes |
Standards | Relationship |
NEN-IEC 60050-561:2014/A3:2021 | Identical |
NEN IEC 60050-561 : 2014 AMD 1 2016 | Identical |
NEN-IEC 60050-561:2014 | Identical |
NEN 10050-561 : 92 AMD 2 97 | Similar to |
BIS IS 1885-44 : 2001 | Identical |
NFC 01 561 : 91 AMD 2 1998 | Identical |
UNE 21302-561:1992 | Identical |
BS EN 61337-1:2004 | Filters using waveguide type dielectric resonators Generic specification |
BS EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
12/30258507 DC : 0 | BS EN 62575-1 - RADIO FREQUENCY (RF) BUK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods |
BS EN 62575-1:2016 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification |
DD IEC/TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters |
04/30111604 DC : 0 | IEC 61994-4-4 ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION GLOSSARY - PART 4-4: MATERIALS FOR SAW DEVICES |
15/30325282 DC : 0 | BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
DD IEC/TS 61994-4-1:2007 | Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric materials. Synthetic quartz crystal |
17/30358131 DC : 0 | BS IEC 60122-4 ED.1.0 - QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 4: CRYSTAL UNITS WITH THERMISTORS |
BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
05/30132097 DC : DRAFT JUNE 2005 | IEC 60679-1 ED 3 - QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60689:2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
CEI EN 60689 : 2009 | MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 KHZ TO 200 KHZ AND STANDARD VALUES |
I.S. EN IEC 63041-1:2018 | PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS |
I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN IEC 63041-1:2018 | Piezoelectric sensors - Part 1: Generic specifications |
I.S. EN 62575-1:2016 | RADIO FREQUENCY (RF) BULK ACOUSTIC WAVE (BAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 61253-1:1993 | Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval |
NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 60139:2000 | Preparation of outline drawings for cathode-ray tubes, their components, connections and gauges |
EN 61337-1:2004 | Filters using waveguide type dielectric resonators - Part 1: Generic specification |
EN 61019-1 : 2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
EN 60689:2009 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
15/30300738 DC : DRAFT MAY 2015 | BS EN 60027-2 ED 4.0 - LETTER SYMBOLS TO BE USED IN ELECTRICAL TECHNOLOGY - PART 2: TELECOMMUNICATIONS AND ELECTRONICS |
BS EN 169000:1993 | Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators |
BS EN 61338-1:2005 | Waveguide type dielectric resonators Generic specification |
03/103741 DC : DRAFT FEB 2003 | IEC 61338-1 ED.1 - WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
14/30282293 DC : 0 | BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality Generic specification |
I.S. EN 61337-1:2005 | FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
EN 62884-2:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method |
EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
CEI EN 60679-1 : 2009 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60368-1:2000 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters |
IEC TS 61994-1:2007 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators |
IEC TS 61994-4-4:2010 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices |
IEC 63041-2:2017 | Piezoelectric sensors - Part 2: Chemical and biochemical sensors |
17/30337173 DC : 0 | BS EN 62884-4 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 4: SHORT-TERM FREQUENCY STABILITY TEST METHODS |
BS EN 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification |
12/30252220 DC : DRAFT MAR 2012 | BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION |
BS EN 61019-1:2005 | Surface acoustic wave (SAW) resonators Generic specification |
BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
DD IEC/TS 61994-4-4:2010 | Piezoelectric and dielectric devices for frequency control and selection. Glossary Materials Materials for surface acoustic wave (SAW) devices |
CEI EN 60368-1 : 2006 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BIS IS/IEC 60862-1 : 2003 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
BS EN 60368-1:2000 | Piezoelectric filters Generic specification |
06/30140677 DC : DRAFT SEP 2006 | IEC TS 61994-4-3 ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 4-3: MATERIALS FOR DIELECTRIC DEVICES |
BS EN 62884-2:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method |
BS EN 167000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: piezoelectric filters |
I.S. EN IEC 63041-2:2018 | PIEZOELECTRIC SENSORS - PART 2: CHEMICAL AND BIOCHEMICAL SENSORS |
CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 61338-1:2005 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1: GENERIC SPECIFICATION |
I.S. EN 61019-1:2005 | SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
IEC 63041-1:2017 | Piezoelectric sensors - Part 1: Generic specifications |
I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
NF EN 60679-1 : 2013 | QUARTZ CRYSTAL CONTROLLED OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 60368-1:2000+AMD1:2004 CSV | Piezoelectric filters of assessed quality - Part 1: Genericspecification |
IEC 61337-1:2004 | Filters using waveguide type dielectric resonators - Part 1: Generic specification |
IEC 62575-1:2015 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
00/201812 DC : DRAFT APR 2000 | IEC 61994-4-1 TS/ED. 1 - GLOSSARY FOR PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - PART 4-1: SYNTHETIC QUARTZ CRYSTAL |
03/103740 DC : DRAFT FEB 2003 | IEC 61337-1 ED.1 - FILTERS USING WAVEGUIDE TYPE DIELECTRIC RESONATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 62884-2:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 2: PHASE JITTER MEASUREMENT METHOD |
09/30200793 DC : 0 | BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS |
BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
EN IEC 63041-2:2018 | Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors |
IEC TS 61994-3:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators |
IEC 62604-1:2015 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification |
IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
IEC 61338-1:2004 | Waveguide type dielectric resonators - Part 1: Generic specification |
EN 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
11/30243576 DC : DRAFT FEB 2011 | BS EN 62643-1 - ELECTROSTATIC MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
02/203179 DC : DRAFT FEB 2002 | IEC 61994-3 TS. ED.1 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 3: PIEZOELECTRIC OSCILLATORS |
DD IEC/TS 61994-1:2007 | Piezoelectric and dielectric devices for frequency control and selection. Glossary Piezoelectric and dielectric resonators |
02/206181 DC : DRAFT MAY 2002 | IEC 61019-1. ED.1 - SURFACE ACOUSTIC WAVE RESONATORS (SAW) OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
10/30240248 DC : 0 | BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
15/30299203 DC : 0 | BS EN 60500 ED 2.0 - UNDERWATER ACOUSTICS - HYDROPHONES - PROPERTIES OF HYDROPHONES IN THE FREQUENCY RANGE 1 HZ TO 500 KHZ |
EN IEC 62884-3:2018 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods |
I.S. EN 62604-1:2015 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 62884-1 : 1ED 2018 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60862-1:2015 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC TS 61994-4-1:2007 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal |
EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
EN 60368-1:2000/A1:2004 | PIEZOELECTRIC FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 62575-1:2016 | Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification |
EN 60139:2001 | Preparation of outline drawings for cathode-ray tubes, their components, connections and gauges |
EN 61338-1:2005 | Waveguide type dielectric resonators - Part 1: Generic specification |
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