NBN EN 60749-1 : 2004
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL
Published date
12-01-2013
Publisher
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
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