Semiconductor devices. Mechanical and climatic test methods General

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

07-07-2003

Publisher

British Standards Institution

INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Committee	EPL/47
DevelopmentNote	Supersedes 01/203181 DC (07/2003) Supersedes BS EN 60749. (09/2005)
DocumentType	Standard
Pages	12
PublisherName	British Standards Institution
Status	Current
Supersedes	BS EN 60749:1999 01/203181 DC : DRAFT MAY 2001

Standards	Relationship
IEC 60749-1:2002	Identical
UNE-EN 60749-1:2004	Identical
SN EN 60749-1 : 2003	Identical
NBN EN 60749-1 : 2004	Identical
NF EN 60749-1 : 2003	Identical
I.S. EN 60749-1:2003	Identical
EN 60749-1:2003	Identical
DIN EN 60749-1:2003-12	Identical

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BS EN 60749-1:2003

Semiconductor devices. Mechanical and climatic test methods General

Table of Contents

Abstract

Scope

General Product Information

International Equivalents

Category

Subcategory