UNI EN 12698-2 : 2007
Current
The latest, up-to-date edition.
CHEMICAL ANALYSIS OF NITRIDE BONDED SILICON CARBIDE REFRACTORIES - PART 2: XRD METHODS
28-08-2007
Foreword
1 Scope
2 Normative references
3 Definitions
4 Apparatus
5 Sampling
6 Procedure
6.1 Sample preparation
6.2 Measuring parameters
6.3 Qualitative analysis
6.4 Quantitative analysis
7 Precision
7.1 Repeatability
7.2 Reproducibility
8 Test report
Annex A (normative) X-ray diffraction data for the
determination of Beta'-SiAION content
A.1 General
A.2 Example of calculation of z-value for Beta'-SiAION
Bibliography
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