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  • BS EN 60747-5-3 : 2001

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    DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2001

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Foreword
    1 Scope
    2 Normative references
    3 Measuring methods for photoemitters
      3.1 Luminous intensity of light-emitting diodes (I[v])
      3.2 Radiant intensity of infrared-emitting diodes (I[e])
      3.3 Peak-emission wavelength (lambda[p]), spectral
           radiation bandwidth (deltalambda), and number of
           longitudinal modes (n[m])
      3.4 Emission source length and width and astigmatism
           of a laser diode without pigtail
      3.5 Half-intensity angle and misalignment angle of
           a photoemitter
    4 Measuring methods for photosensitive devices
      4.1 Reverse current under optical radiation of
           photodiodes including devices with or without
           pigtails (I[R(H)] or I[R(E)]), and collector
           current under optical radiation of phototransistors
           (I[C(H)] or I[C(E)])
      4.2 Dark current for photodiodes I[R] and dark currents
           for phototransistors I[CEO], I[ECO], I[EBO]
      4.3 Collector-emitter saturation voltage V[CE(sat)] of
           phototransistors
    5 Measuring methods for photocouplers
      5.1 Current transfer ratio (h[F(ctr)])
      5.2 Input-to-output capacitance (C[io])
      5.3 Isolation resistance between input and output
           (r[IO])
      5.4 Isolation test
      5.5 Partial discharges of photocouplers
      5.6 Collector-emitter saturation voltage V[CE(sat)] of
           a photocoupler
      5.7 Switching times t[on], t[off] of a photocoupler
      5.8 Peak off-state current (I[DRM])
      5.9 Peak on-state voltage (V[TM])
      5.10 DC off-state current (I[BD])
      5.11 DC on-state voltage (V[T])
      5.12 Holding current (I[H])
      5.13 Critical rate of rise of off-state voltage (dV/dt)
      5.14 Trigger input current (I[FT])
      5.15 Testing methods of electrical rating for
           phototriac coupler
    Annex A (informative) Cross references index

    Abstract - (Show below) - (Hide below)

    Defines the measuring methods that applies to the optoelectronic devices, which are not intended to be used in the fibre optic systems or subsystems.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47/3
    Development Note To be read in conjunction with IEC 60747-1, IEC 62007-1 and IEC 62007-2 Renumbers and supersedes BS IEC 60747-5.3 2001 Version incorporates 13434 to BS IEC 60747-5.3 (01/2002) Supersedes 00/202969 DC (02/2003)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
    EN 60068-1:2014 ENVIRONMENTAL TESTING - PART 1: GENERAL AND GUIDANCE (IEC 60068-1:2013)
    IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
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