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  • IEC 61751:1998

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Laser modules used for telecommunication - Reliability assessment

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  02-02-2012

    Language(s):  English - French

    Published date:  26-02-1998

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Laser reliability and quality assurance procedure
        4.1 Demonstration of product quality
        4.2 Testing responsibilities
        4.3 Quality Improvement Programmes (QIPs)
    5 Tests
        5.1 Structural similarity
        5.2 Burn-in and screening (when applicable in the DS)
    6 Activities
        6.1 Analysis of reliability results
        6.2 Technical visits to LMMs
        6.3 Design/process changes
        6.4 Deliveries
        6.5 Supplier documentation
    Annex A (normative) Laser diode and laser module failure
    mechanisms
    Annex B (informative) Guide
    Figures
        A.1 Non-linearities in laser-current characteristics
        A.2 'Bathtub' failure rate curve
        A.3 Example of cumulative failure plot showing log-normal
              distribution of laser failure rate
        A.4 Calculated failure rates for components having a
              log-normal lifetime distribution, with a median
              life of 10(6)h and dispersion in the range of
              0.5 to 2.0
        A.5 Cross-section through a typical laser module showing
              key components
        A.6 Cross-section through a typical buried heterostructure
              laser (bonded junction side up)

    Abstract - (Show below) - (Hide below)

    The aim of this standard is:- to establish a standard method of assessing the reliability of laser modules in order to minimize risks and to promote product development and reliability;- to establish means by which the distribution of failures with time can be determined. This should enable the determination of equipment failure rates for specified end of life criteria.

    General Product Information - (Show below) - (Hide below)

    Committee TC 86
    Development Note Also numbered as BS EN 61751. (09/2005)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    04/30101075 DC : DRAFT JUN 2004
    I.S. EN 62496-3:2011 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
    BS EN 62496-3 : 2011 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
    11/30249625 DC : 0 BS EN 62149-1 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE
    NF EN 61291 5-2 : 2003 OPTICAL AMPLIFIERS - PART 5-2: QUALIFICATION SPECIFICATIONS - RELIABILITY QUALIFICATION FOR OPTICAL FIBRE AMPLIFIERS
    IEC 60747-5-4:2006 Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
    BS EN 62149-1 : 2012 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE
    07/30170374 DC : DRAFT AUG 2007 BS EN 61751-2 - LASER MODULES USED FOR TELECOMMUNICATIONS - RELIABILITY ASSESSMENT - PART 2: TECHNICAL REPORT ON LASER MODULE DEGRADATION
    02/211632 DC : DRAFT DEC 2002 IEC 69747-5-4 ED.1 - SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-4: OPTOELECTRONIC DEVICES - SEMICONDUCTOR LASERS
    BS IEC 60747-5-4:2006 Semiconductor devices. Discrete devices Optoelectronic devices. Semiconductor lasers
    CEI EN 62149-1 : 2012 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE
    BS EN 62308 : 2006 EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS
    09/30206094 DC : 0 BS EN 62496-3 - OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
    I.S. EN 62149-1:2012 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE (IEC 61753-059-2:201X (86B/3338/CDV) (EQV) + IEC 62149-1:2011 (EQV))
    CEI EN 62496-3 : 2012 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
    I.S. EN 62308:2006 EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS
    DIN EN ISO 17526:2003-10 OPTIC AND OPTICAL INSTRUMENTS - LASERS AND LASER-RELATED EQUIPMENT - LIFETIME OF LASERS
    IEC 62308:2006 Equipment reliability - Reliability assessment methods
    ISO 17526:2003 Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers
    IEC 62149-1:2011 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE
    BS EN ISO 17526:2003 (published 2003-08) Optics and optical instruments. Lasers and laser-related equipment. Lifetime of lasers
    IEC 62496-3:2011 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
    EN 62149-1:2012 FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - PERFORMANCE STANDARDS - PART 1: GENERAL AND GUIDANCE (IEC 62149-1:2011)
    EN 62496-3 : 2011 OPTICAL CIRCUIT BOARDS - PART 3: PERFORMANCE STANDARDS - GENERAL AND GUIDANCE
    EN 62308 : 2006 EQUIPMENT RELIABILITY - RELIABILITY ASSESSMENT METHODS
    EN ISO 17526 : 2003 OPTICS AND OPTICAL INSTRUMENTS - LASERS AND LASER-RELATED EQUIPMENT - LIFETIME OF LASERS

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL STD 883 : K TEST METHOD STANDARD - MICROCIRCUITS
    IEC 60747-12-2:1995 SEMICONDUCTOR DEVICES - OPTOELECTRONIC DEVICES - BLANK DETAIL SPECIFICATION FOR LASER DIODE MODULES WITH PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS
    ISO 9000:2015 Quality management systems Fundamentals and vocabulary
    IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
    IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
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