Name: NBN EN 60749-4 : 2003
Brand: NBN

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)

Published date

12-01-2013

Publisher

Belgian Standards

Foreword
1 Scope
2 HAST test - General remarks
3 Test apparatus
4 Test conditions
5 Procedure
6 Failure criteria
7 Safety
8 Summary
Bibliography

Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

DocumentType	Standard
PublisherName	Belgian Standards
Status	Current

Standards	Relationship
DIN EN 60749-4:2016-06 (Draft)	Identical
UNE-EN 60749-4:2003	Identical
BS EN 60749-4:2017	Identical
EN 60749-4:2017	Identical
NF EN 60749-4 : 2002	Identical
I.S. EN 60749-4:2017	Identical

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NBN EN 60749-4 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)

Table of Contents

Abstract

General Product Information

International Equivalents

Category

Subcategory