SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

Published date

12-01-2013

Publisher

AVANT-PROPOS
INTRODUCTION
1 Domaine d'application
2 Références normatives
3 Termes, définitions et symboles littéraux
4 Conditions atmosphériques normales
5 Mesures électriques
6 Utilisation de dispositifs défectueux électriquement
Annexe ZA (normative) Références normatives â d'autres
publications internationales avec les
publications européennes correspondantes

Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

DevelopmentNote	Indice de classement: C96-022-1. PR NF EN 60749-1 August 2001 (07/2001) Supersedes NF EN 60749. (06/2007)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-1:2003-12	Identical
IEC 60749-1:2002	Identical
EN 60749-1:2003	Identical
UNE-EN 60749-1:2004	Identical
BS EN 60749-1:2003	Identical
I.S. EN 60749-1:2003	Identical

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NF EN 60749-1 : 2003

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL

Table of Contents

Abstract

General Product Information

International Equivalents

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