SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD

Published date

12-01-2013

Publisher

Foreword
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications

Describes the rapid change of temperature test method and the two-fluid-bath method. It is applicable to all semiconductor devices.

DevelopmentNote	Indice de classement: C96-022-11. (03/2003) Supersedes NF EN 60749. (06/2007)
DocumentType	Standard
PublisherName	Association Francaise de Normalisation
Status	Current

Standards	Relationship
DIN EN 60749-11:2003-04	Identical
BS EN 60749-11:2002	Identical
IEC 60749-11:2002	Identical
EN 60749-11:2002	Identical
UNE-EN 60749-11:2003	Identical
I.S. EN 60749-11:2002	Identical

NF EN 60749-30 : 2005 AMD 1 2011

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING