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SEMI E142 : MAR 2006

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SPECIFICATION FOR SUBSTRATE MAPPING

Superseded date

05-10-2020

Published date

12-01-2013

Specifies the data items that are required to report, store and transmit map data for substrates such as wafers, frames, strips and trays.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (02/2005) Includes SEMI E142.1, SEMI E142.2 and SEMI E142.3. (10/2016)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded

SEMI E174 : 2017 SPECIFICATION FOR WAFER JOB MANAGEMENT (WJM)

SEMI E39.1 : 2003(R2014) SECS-2 PROTOCOL FOR OBJECT SERVICES STANDARD (OSS)
SEMI E40 : 2013 STANDARD FOR PROCESSING MANAGEMENT
SEMI E121 : 2017 GUIDE FOR STYLE AND USAGE OF XML FOR SEMICONDUCTOR MANUFACTURING APPLICATIONS
SEMI E90 : 2012(R2018) SPECIFICATION FOR SUBSTRATE TRACKING
SEMI E39 : 2003(R2014) OBJECT SERVICES STANDARD: CONCEPTS, BEHAVIOUR, AND SERVICES

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