EN 100012 : 1995

Name: EN 100012 : 1995
Brand: CEN

Withdrawn

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BASIC SPECIFICATION: X-RAY INSPECTION OF ELECTRONIC COMPONENTS

Withdrawn date

23-07-2013

Published date

12-01-2013

Publisher

Comite Europeen de Normalisation

1 Definitions
1.1 Radiography
1.2 Radioscopy
1.3 Searchray Camera
2 Scope
3 Equipment and materials
4 Procedure
4.1 General
4.2 Mounting of components
4.3 Indicators for the spatial resolution
4.4 Indicators for the image contrast
4.5 Positioning of components
4.6 Radiation direction
4.7 Marking of documents
4.8 Information concerning radiographic
4.9 Information concerning radioscopy
4.10 Operating personnel
5 Interpretation of results
6 Reports and records
6.1 Reports of inspection
6.2 Presentation of radiographs
6.3 Retention of reports and inspection records
7 Examination and acceptance criteria

Describes the equipment and procedures to be used for the inspection of electronic components by means of radiography and radioscopy.

Committee	NC DKE
DevelopmentNote	Supersedes CECC 00012: 1985
DocumentType	Standard
PublisherName	Comite Europeen de Normalisation
Status	Withdrawn

Standards	Relationship
NBN EN 100012 : 2008	Identical
I.S. EN 100012:1995	Identical
BS EN 100012:1996	Identical
SN EN 100012 : 1995	Identical
PN EN 100012 : 2002	Identical
NEN EN 100012 : 1995	Identical
DIN EN 100012:1995-09	Identical
UNE-EN 100012:1994	Identical

BS EN 165000-1:1996	Film and hybrid integrated circuits Generic specification. Capability approval procedure
IEC 60748-23-2:2002	Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests
BS EN 165000-3:1996	Film and hybrid integrated circuits Self-audit checklist and report for film and hybrid integrated circuit manufacturers
I.S. EN 165000-1:1998	FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION CAPABILITY APPROVAL PROCEDURE
BS IEC 60748-23-2:2002	Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Internal visual inspection and special tests
I.S. EN 165000-3:1998	FILM AND HYBRID INTEGRATED CIRCUITS - PART 3: SELF-AUDIT CHECKLIST AND REPORT FOR FILM AND HYBRID INTEGRATED CIRCUIT MANUFACTURERS
EN 165000-3:1996	Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
EN 165000-1:1996	Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure